Title :
SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics
Author :
Manfredi, Paolo ; Biondi, A. ; Ginste, Dries Vande ; De Zutter, Daniel ; Canavero, Flavio G.
Author_Institution :
Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
Abstract :
This paper proposes an exact formalism for the inclusion of nonlinear elements with polynomial I-V characteristic into the polynomial chaos framework for statistical circuit simulation, which was so far limited to linear circuits. The formulation is SPICE-compatible, thus allowing the convenient integration of such nonlinear elements into standard circuit solvers. This contribution represents a considerable step forward towards the inclusion of nonlinear terminations into the SPICE- and polynomial chaos-based statistical analysis of interconnects with stochastic parameters. The theory is illustrated and validated by means of an application example.
Keywords :
SPICE; chaos; circuit simulation; nonlinear network analysis; polynomials; statistical analysis; transmission lines; SPICE-based statistical analysis; interconnects; nonlinear elements; nonlinear terminations; polynomial I-V characteristics; polynomial chaos framework; standard circuit solvers; statistical circuit simulation; stochastic parameters; Analytical models; Integrated circuit interconnections; Integrated circuit modeling; Monte Carlo methods; Polynomials; Standards; Stochastic processes; Circuit modeling; circuit simulation; nonlinear; polynomial chaos; stochastic analysis; transmission lines; uncertainty;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-0705-2
DOI :
10.1109/EPEPS.2013.6703475