• DocumentCode
    67018
  • Title

    Study on the Addressing Characteristics of an ac PDP With Sc-Doped MgO-Protecting Layer

  • Author

    Kim, Jae-Kuk

  • Author_Institution
    Department of Electrical and Information Engineering, Seoul National University of Science and Technology, Seoul, Korea
  • Volume
    41
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2377
  • Lastpage
    2380
  • Abstract
    In this paper, the addressing characteristics of an ac plasma display panel (PDP) with Sc-doped MgO-protecting layer are investigated. The characteristics of addressing voltage and temporal distribution of addressing discharge event in Sc-doped MgO panel are different from those in a conventional MgO panel. In particular, the characteristics depending on the operation temperature are changed drastically in Sc-doped MgO panel. The formative discharge time lag increases as the addressing pulse application time and operation temperature increase regardless of protecting layers. The statistical time lag shows the contrary trend compared to the formative discharge time lag except for the MgO when operated in room temperature. The variation of addressing voltage and temporal distribution of addressing discharge event in different protecting layers can be understood through the survey of previous research result on the exoelectron emission characteristics from protecting layers in an ac PDP. It is assumed that the emission of electrons from a protecting layer results in the decrease of wall voltage but increase of priming effect for the addressing discharge. Also, the possibility for the control of addressing characteristics is suggested by changing scan voltage level during address period.
  • Keywords
    Discharges (electric); Electric fields; Electron emission; Magnesium oxide; Plasma displays; Addressing characteristics; Sc-doped MgO-protecting layer; plasma display panel; temporal distribution of addressing discharge event;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2257875
  • Filename
    6517288