DocumentCode :
67019
Title :
32 dBm Power Amplifier on 45 nm SOI CMOS
Author :
Wilk, Seth J. ; Lepkowski, William ; Thornton, Trevor J.
Author_Institution :
SJT Micropower Inc., Fountain Hills, CO, USA
Volume :
23
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
161
Lastpage :
163
Abstract :
A silicon metal-semiconductor-field-effect-transistor (MESFET) power amplifier operating at 900 MHz fabricated on a 45 nm silicon-on-insulator CMOS process with no changes to the process flow is presented. The soft breakdown of the MESFET is 20 times that of the MOSFET and allowed a single transistor amplifier based on Class A bias conditions to operate at up to 32 dBm output power with an 8 V drain bias. The amplifier had a peak power added efficiency of 37.6%, gain of 11.1 dB, OIP3 of 39.3 dBm and 1 dB compression point at an output power of 31.6 dBm. The device required only 0.125 mm 2 of active area. Additionally, the depletion mode operation of the MESFET enables a simple input bias approach using an inductor to ground at the gate of the device.
Keywords :
CMOS analogue integrated circuits; UHF power amplifiers; elemental semiconductors; power MESFET; silicon; silicon-on-insulator; MOSFET; SOI CMOS; class-A bias amplifier; depletion mode operation; efficiency 37.6 percent; frequency 900 MHz; gain 11.1 dB; inductor; silicon MESFET power amplifier; silicon metal semiconductor field effect transistor power amplifier; silicon-on-insulator CMOS process; single-transistor amplifier; size 45 nm; voltage 8 V; CMOS integrated circuits; Logic gates; MESFETs; Power amplifiers; Power generation; Power measurement; Silicon; Metal-semiconductor-field-effect-transistor (MESFET); power amplifiers (PAs); silicon-on-insulator (SOI) technology;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2013.2245413
Filename :
6469182
Link To Document :
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