Title :
Modelling of high voltage SF6 circuit breaker reliability based on Bayesian statistics
Author :
Muratovic, M. ; Sokolija, Kemo ; Kapetanovic, M.
Author_Institution :
Fac. of Electr. Eng. Sarajevo, Univ. of Sarajevo, Sarajevo, Bosnia-Herzegovina
Abstract :
The biggest drawback in modelling the reliability of high voltage circuit breakers is the lack of access to data on failures in service, due to the very long lifetime of circuit breakers. This paper presents the application of reliability calculation based on Bayesian statistics to a 245 kV SF6 circuit breaker and its operating mechanism. By using the Bayesian theorem, the prior probability density function of failures in circuit breaker components, which is calculated based on data on the circuit breaker and the operating mechanism failures in service, is combined with data on the failures registered during an extensive mechanical development tests. During the tests more than 32000 "CO" (close-open) operations were performed. Based on the posterior probability density function, the reliability of circuit breaker components and the overall reliability of the breaker is estimated. The paper also presents some analysis of the impact of circuit breaker maintenance on its reliability.
Keywords :
SF6 insulation; circuit breakers; maintenance engineering; probability; reliability; Bayesian statistics; Bayesian theorem; SF6; circuit breaker components reliability; circuit breaker maintenance; high voltage SF6 circuit breaker reliability modelling; mechanical development tests; posterior probability density function; probability density function; reliability calculation; voltage 245 kV; Bayes methods; Circuit breakers; Gaussian distribution; Integrated circuit reliability; Probability density function; Springs; Bayesian statistics; circuit breaker maintenance; high voltage circuit breakers; probability density function; reliability calculation;
Conference_Titel :
GCC Conference and Exhibition (GCC), 2013 7th IEEE
Conference_Location :
Doha
Print_ISBN :
978-1-4799-0722-9
DOI :
10.1109/IEEEGCC.2013.6705794