• DocumentCode
    670665
  • Title

    STT-MRAM and NV-Logic for low power systems

  • Author

    Endoh, Tetsuo

  • Author_Institution
    Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2013
  • fDate
    28-29 Oct. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Recently in semiconductor memories, it is becoming difficult to meet the target performance requirements by technology development based solely on device scaling. Especially, due to the increase in memory capacity, increased operation speed and increased leakage current of MOSFET, the power consumption of LSI is rapidly increasing.
  • Keywords
    MOSFET; MRAM devices; large scale integration; leakage currents; logic circuits; low-power electronics; power consumption; LSI; MOSFET; NV-logic; STT-MRAM; device scaling; leakage current; low power systems; memory capacity; operation speed; power consumption; semiconductor memories; Junctions; Magnetic tunneling; Magnetoelectronics; Memory management; Nonvolatile memory; Random access memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Efficient Electronic Systems (E3S), 2013 Third Berkeley Symposium on
  • Conference_Location
    Berkeley, CA
  • Type

    conf

  • DOI
    10.1109/E3S.2013.6705864
  • Filename
    6705864