DocumentCode :
671137
Title :
Design and analysis of a low-voltage electrostatic actuated RF CMOS-MEMS switch
Author :
Ma Li Ya ; Nordin, A.N. ; Soin, Norhayati
Author_Institution :
Dept. of Electr. Eng., Univ. of Malaya, Kuala Lumpur, Malaysia
fYear :
2013
fDate :
25-27 Sept. 2013
Firstpage :
41
Lastpage :
44
Abstract :
This paper presents the design and analysis of a radio frequency (RF) micro-electromechanical system (MEMS) switch with low actuation voltage using MIMOS 0.35μm complementary metal oxide semiconductor (CMOS) process. The advantage of this RF MEMS switch is very low actuation voltage design which is compatible with other CMOS circuit without employing a separate on-chip voltage source or charge pump unit. Moreover, using CMOS technology to design can highly simplify the fabrication process, reduce the cost and improve the device performance. The RF MEMS switch is a capacitive shunt-connection type device which uses four folded beams to support a big membrane above the signal transmission line. The pull-in voltage, von Mises stress distribution and vertical displacement of the membrane, up-state and down-state capacitances, as well as the switch impedance is calculated and analyzed by finite element modelling (FEM) simulation.
Keywords :
capacitance; electric impedance; field effect transistor switches; finite element analysis; integrated circuit design; integrated circuit modelling; low-power electronics; microswitches; radiofrequency integrated circuits; FEM simulation; capacitive shunt-connection type device; complementary metal oxide semiconductor process; down-state capacitance; finite element modelling; low-voltage electrostatic actuated RF CMOS-MEMS switch; membrane vertical displacement; microelectromechanical system; pull-in voltage; radio frequency switch; size 0.35 mum; switch impedance; up-state capacitance; von Mises stress distribution; CMOS integrated circuits; CMOS technology; Capacitance; Microswitches; Radio frequency; Switching circuits; CMOS-MEMS; RF; low-voltage; switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro and Nanoelectronics (RSM), 2013 IEEE Regional Symposium on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4799-1181-3
Type :
conf
DOI :
10.1109/RSM.2013.6706468
Filename :
6706468
Link To Document :
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