• DocumentCode
    671146
  • Title

    Annealing effects on structural and electrical properties of micro heater conductor element

  • Author

    Hamid, N.A. ; Majlis, Burhanuddin Yeop ; Yunas, Jumril ; Dehzangi, Abdollah

  • Author_Institution
    Inst. of Microeng. & Nanoelectron. (IMEN), Univ. Kebangsaan Malaysia (UKM), Bangi, Malaysia
  • fYear
    2013
  • fDate
    25-27 Sept. 2013
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    This paper presents an analysis and investigation of the effect thermal anealing treatment on structural and electrical properties of micro heater conductor. Conventional micro fabrication process has given a higher resistance impact on the heater conductor properties. Higher conductor resistance obtains higher source for micro heater to be operated. Since the micro heater is used for micron-sized devices, only small amount of source is consumed for the micro component. Therefore annealing process is necessary to reduce the resistance of metal conductor heater. In this work, the thermal annealing treatment process was carried out in nitrogen atmosphere at temperature of 450°C for 30 minutes. Structural properties were studied using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) while an electrical property was investigated using heater characterization measurement and testing. The analysis shows that thermal annealing treatment improved the electrical properties of the heater conductor element and provided some changes in samples, such as the grain size increment or the decrease of the strain.
  • Keywords
    annealing; atomic force microscopy; grain size; micromechanical devices; platinum; scanning electron microscopy; Pt; atomic force microscopy; electrical properties; grain size; heater characterization measurement; microheater conductor element; nitrogen atmosphere; scanning electron microscopy; structural properties; thermal annealing treatment; Annealing; Conductors; Platinum; Resistance; Resistance heating; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro and Nanoelectronics (RSM), 2013 IEEE Regional Symposium on
  • Conference_Location
    Langkawi
  • Print_ISBN
    978-1-4799-1181-3
  • Type

    conf

  • DOI
    10.1109/RSM.2013.6706477
  • Filename
    6706477