DocumentCode :
671196
Title :
Simulation of Mach Zehnder Interleaver based thermo-optic effect in L-Band range
Author :
Palupi, Ratih Retno ; Syahriar, Ary ; Lubis, Ahmad H. ; Rahardjo, Sasono ; Sardjono
Author_Institution :
Dept. of Electr. Eng., Univ. of Al Azhar Indonesia, Jakarta, Indonesia
fYear :
2013
fDate :
25-27 Sept. 2013
Firstpage :
269
Lastpage :
272
Abstract :
Optical device based on Mach Zehnder Interferometer (MZI) is usually used as the optical switching, modulator and many applications in telecommunication networks. This paper discuss the Temperature Effect of Wavelength Division Multiplexing (WDM) Interleaver by using single and cascaded MZI. The Sellmeier equation is used to calculate the refractive index changing caused by the temperature changing. The output power of MZI is obtained by using matrix equation. The characteristic of output power varied with several temperatures between 28 and 300 degree Celsius. The wavelength used in this simulation is in L-Band region which is about 1570-1610nm. Temperature changing cause the changing of refractive index of material. The temperature changing leads to the shifting of wavelength channel which describe the characteristic of thermo optic effect on single and cascaded MZI.
Keywords :
Mach-Zehnder interferometers; optical communication equipment; refractive index; thermo-optical devices; thermo-optical effects; wavelength division multiplexing; L-band range; Mach Zehnder interleaver; Mach-Zehnder interferometer; Sellmeier equation; WDM interleaver; cascaded MZI; matrix equation; optical device; refractive index; single MZI; temperature 28 degC to 300 degC; temperature effect; thermo-optic effect; wavelength channel; wavelength division multiplexing interleaver; Mathematical model; Optical fibers; Optical interferometry; Optical refraction; Refractive index; Temperature; Sellmeier Equation; Thermo-optic effect; single and cascaded Mach Zehnder Interferometer; transfer matrix method; wavelength shift;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro and Nanoelectronics (RSM), 2013 IEEE Regional Symposium on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4799-1181-3
Type :
conf
DOI :
10.1109/RSM.2013.6706527
Filename :
6706527
Link To Document :
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