• DocumentCode
    671275
  • Title

    Degradation processes in high-power diode lasers under external optical feedback

  • Author

    Tomm, Jens W. ; Hempel, Michael ; Mingjun Chi ; Petersen, P.M. ; Zeimer, U. ; Weyers, M.

  • Author_Institution
    Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin, Germany
  • fYear
    2013
  • fDate
    16-17 Oct. 2013
  • Firstpage
    42
  • Lastpage
    43
  • Abstract
    The effect of moderate external feedback on the gradual degradation of 808 nm emitting AlGaAs-based high-power broad-area diode lasers is analyzed. Eventually the quantum well that actually experiences the highest total optical load remains unaffected by the aging, while severe impact to the waveguide by point defects is observed.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser feedback; optical waveguides; quantum well lasers; AlGaAs; degradation processes; external optical feedback; high-power broad-area diode lasers; optical load; point defects; quantum well; waveguide; wavelength 808 nm; Aging; Degradation; Diode lasers; Laser beams; Measurement by laser beam; Optical feedback; Optical waveguides; Degradation; Diode lasers; Laser feedback; Optical feedback;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Power Diode Lasers and Systems Conference (HPD), 2013
  • Conference_Location
    Coventry
  • Print_ISBN
    978-1-4799-2747-0
  • Type

    conf

  • DOI
    10.1109/HPD.2013.6706609
  • Filename
    6706609