Title :
Advanced thin copper electroplating process for HDI microvia filling application
Author :
Ming-Yao Yen ; Ming-Hung Chiang ; Hsu-Hsin Tai ; Hsien-Chang Chen ; Kwok-Wai Yee ; Li, Cong ; Najjar, Elie ; Lefebvre, M. ; Xie, Bo
Author_Institution :
Dow Electron. Mater., Dow Chem. Co., Taoyuan Hsien, Taiwan
Abstract :
Electrolytic copper microvia filling is an enabling technology, prominently used in today´s manufacture of high density interconnect (HDI) and packaging substrate applications for better reliability, increased circuit densification, design flexibility and thermal management. To meet these needs, seemingly incompatible objectives must be met. Thinner and more uniform surface copper deposits have to be produced; increasingly difficult microvia geometries must be filled, while maintaining plating rates capable of delivering production throughputs. This paper describes a new panel and pattern-plate, direct current (DC) copper electroplating process designed for packaging substrate and HDI applications. Microvia filling performance, surface distribution and product reliability as a function of a variety of physical processing variables is discussed.
Keywords :
copper; electronics packaging; electroplating; interconnections; reliability; vias; Cu; HDI microvia filling application; circuit densification; design flexibility; high density interconnect; packaging substrate applications; plating rates; product reliability; reliability; surface distribution; thermal management; thin copper electroplating process; Anodes; Copper; Current density; Filling; Production; Substrates; Surface treatment;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
Conference_Location :
Taipei
DOI :
10.1109/IMPACT.2013.6706698