Title :
Multi-Dimensional Classification with Super-Classes
Author :
Read, Jesse ; Bielza, Concha ; Larranaga, Pedro
Author_Institution :
Univ. Carlos III de Madrid, Leganés, Spain
Abstract :
The multi-dimensional classification problem is a generalization of the recently-popularized task of multi-label classification, where each data instance is associated with multiple class variables. There has been relatively little research carried out specific to multi-dimensional classification and, although one of the core goals is similar (modeling dependencies among classes), there are important differences; namely a higher number of possible classifications. In this paper we present method for multi-dimensional classification, drawing from the most relevant multi-label research, and combining it with important novel developments. Using a fast method to model the conditional dependence between class variables, we form super-class partitions and use them to build multi-dimensional learners, learning each super-class as an ordinary class, and thus explicitly modeling class dependencies. Additionally, we present a mechanism to deal with the many class values inherent to super-classes, and thus make learning efficient. To investigate the effectiveness of this approach we carry out an empirical evaluation on a range of multi-dimensional datasets, under different evaluation metrics, and in comparison with high-performing existing multi-dimensional approaches from the literature. Analysis of results shows that our approach offers important performance gains over competing methods, while also exhibiting tractable running time.
Keywords :
pattern classification; conditional dependence; core goals; data instance; evaluation metrics; modeling class dependencies; multidimensional classification problem; multidimensional datasets; multidimensional learners; multilabel classification; multilabel research; multiple class variables; ordinary class; recently-popularized task; super classes; super-class partitions; tractable running time; Accuracy; Bayes methods; Context; Integrated circuit modeling; Training; Vectors; Multi-dimensional classification; classification; multi-dimensional; problem transformation;
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
DOI :
10.1109/TKDE.2013.167