Title :
Normal-Metal Hot-Electron Nanobolometer With Johnson Noise Thermometry Readout
Author :
Karasik, Boris S. ; McKitterick, Christopher B. ; Reck, Theodore J. ; Prober, Daniel E.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The sensitivity of a THz hot-electron nanobolometer (nano-HEB) made from a normal metal is analyzed. Johnson Noise Thermometry (JNT) is employed as a readout technique. In contrast to its superconducting Transition-Edge Sensor (TES) counterpart, the normal-metal nano-HEB can operate at any cryogenic temperature depending on the required radiation background limited Noise Equivalent Power (NEP). It does not require bias lines; 100s of nano-HEBs can be read by a single low-noise X-band amplifier via a filter bank channelizer. The modeling predicts that even with the sensitivity penalty due to the amplifier noise, an NEP ~ 10-20-10-19W/Hz1/2 can be expected at 50-100 mK in 10-20 nm thin titanium (Ti) normal metal HEBs with niobium (Nb) contacts. This NEP is fairly constant over a range of readout frequencies ~ 10 GHz. Although materials with weaker electron-phonon coupling (bismuth, graphene) do not improve the minimum achievable NEP, they can be considered if a larger than 10 GHz readout bandwidth is required.
Keywords :
bolometers; channel bank filters; cryogenics; low noise amplifiers; nanosensors; niobium compounds; readout electronics; temperature measurement; terahertz wave detectors; thermal noise; JNT; Johnson noise thermometry; NEP; NbTiN; THz hot electron nanobolometer; amplifier noise; cryogenic temperature; electron-phonon coupling; filter bank channelizer; noise equivalent power; normal metal nano-HEB; radiation background; readout technique; single low noise band amplifier; size 10 nm to 20 nm; superconducting TES; temperature 50 mK to 100 mK; transition edge sensor; Bandwidth; Detectors; Metals; Photonics; Superconducting device noise; Thermal conductivity; Hot-electron; Johnson noise thermometry (JNT); THz astrophysics; nanobolometer;
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2014.2370755