DocumentCode :
672539
Title :
Optimized allocation of STATCOMs based on equivalent impedance modeling of VSCs using genetic algorithm
Author :
Hashemi-Dezaki, Hamed ; Askarian-Abyaneh, Hossein ; Mohammadalizade-Shabestary, Masoud ; Yaghoubinia, Mohammadreza
Author_Institution :
Electr. Eng. Dept., Amirkabir Univ., Tehran, Iran
fYear :
2013
fDate :
28-30 Aug. 2013
Firstpage :
1
Lastpage :
5
Abstract :
Static synchronous Compensators (STATCOMs) as a flexible AC transmission system (FACTS) controller can improve the power system parameters if they have been optimally allocated. In this paper, a novel approach is introduced to optimize the placement of STATCOMs according to a new objective function including voltage profile of different system points (VP) and transmission capability indices. Using equivalent impedance modeling of voltage source converters (VSCs) and sensitivity analysis in order to calculate the required indices help improve the speed of calculations and the convergence rate of optimization problem solving. Genetic Algorithm (GA) is used to solve the optimization problem. The proposed method is applied on a test system. The test results can clarify the effectiveness of the proposed method.
Keywords :
flexible AC transmission systems; genetic algorithms; power convertors; sensitivity analysis; static VAr compensators; FACTS; GA; VP; VSCs; equivalent impedance modeling; flexible AC transmission system controller; genetic algorithm; objective function; optimization problem; optimized STATCOM allocation; power system parameters; sensitivity analysis; static synchronous compensators; test system; transmission capability indices; voltage profile; voltage source converters; Automatic voltage control; Impedance; Linear programming; Load flow; Optimization; Power system stability; Resource management; Genetic Algorithm (GA); Optimized Placement; Static Synchronous Compensators (STATCOM); Transient Stability; Transmission Capability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Smart Energy Grid Engineering (SEGE), 2013 IEEE International Conference on
Conference_Location :
Oshawa, ON
Print_ISBN :
978-1-4799-2774-6
Type :
conf
DOI :
10.1109/SEGE.2013.6707923
Filename :
6707923
Link To Document :
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