• DocumentCode
    672986
  • Title

    Analog Circuit Fault Diagnosis Based on Wavelet Kernel Support Vector Machine

  • Author

    Ke Guo ; Sheling Wang ; Jiahong Song

  • Author_Institution
    Beijing Inst. of Space Long March Vehicle, Beijing, China
  • fYear
    2013
  • fDate
    16-17 Nov. 2013
  • Firstpage
    395
  • Lastpage
    399
  • Abstract
    Analog circuit fault diagnosis can be regarded as the pattern recognition issue and addressed by machine learning theory. As compared with neural networks, support Vector Machine (SVM) is based on statistical learning theory, which has advantages of better classification ability and generalization performance. The marr wavelet kernel is proposed and the existence is proven by theoretic analysis and demonstration. Based on this, a novel analog circuit fault diagnosis method which is called wavelet kernel support vector machine is proposed in the paper. Using principal component analysis (PCA) as a tool for extracting fault features, the WSVM is then applied to the analog circuit fault diagnosis. The effectiveness of the proposed method is verified by the experimental results.
  • Keywords
    analogue circuits; circuit analysis computing; fault diagnosis; feature extraction; learning (artificial intelligence); pattern classification; principal component analysis; support vector machines; wavelet transforms; PCA; WSVM; analog circuit fault diagnosis; classification ability; fault feature extraction; generalization performance; machine learning theory; marr wavelet kernel; neural networks; pattern recognition issue; principal component analysis; statistical learning theory; wavelet kernel support vector machine; Analog circuits; Circuit faults; Fault diagnosis; Feature extraction; Kernel; Principal component analysis; Support vector machines; analog circuit; fault diagnosis; support vector machine; wavelet kernel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Applications (ITA), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-2876-7
  • Type

    conf

  • DOI
    10.1109/ITA.2013.97
  • Filename
    6710013