NMOS/PMOS resistance calibration method using reference frequency

Author

Melikyan, Vazgen ; Balabanyan, Abraham ; Hayrapetyan, Artak ; Durgaryan, Armen

Author_Institution

Synopsys Armenia CJSC, Yerevan, Armenia

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

6

Abstract

A method of NMOS and PMOS transistor resistance variation detection and compensation, using reference clock frequency is presented. The proposed method provides opportunity to measure and compensate MOS device resistance deviation, due to technology process, voltage and temperature variations, separately. Detection of variations is realized using the proposed digital logic block. Efficiency of the suggested method is tested and presented for a high-speed voltage controlled oscillator.

Keywords

MOSFET; calibration; compensation; electric resistance measurement; sensors; voltage-controlled oscillators; NMOS transistor resistance variation detection; NMOS-PMOS resistance calibration method; PMOS transistor resistance variation detection; compensation; digital logic block; high-speed voltage controlled oscillator; reference clock frequency; Calibration; Clocks; MOSFET; Resistance; Voltage-controlled oscillators; PVT compensation; VCO frequency; calibration; nmos; pmos; resistance variation;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Science and Information Technologies (CSIT), 2013

Conference_Location

Yerevan

Print_ISBN

978-1-4799-2460-8

Type

conf

DOI

10.1109/CSITechnol.2013.6710330

Filename

6710330