• DocumentCode
    67308
  • Title

    Slant Field Plate Model for Field-Effect Transistors

  • Author

    Coffie, Robert

  • Author_Institution
    Dept. of R&D, TriQuint, Richardson, TX, USA
  • Volume
    61
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2867
  • Lastpage
    2872
  • Abstract
    The simplified field plate model for field-effect transistors previously introduced is further developed to allow arbitrary transition angles between gate and field plate or adjacent field plates. The model shows that transition angles less than 30° (measured from the surface) can result in significant improvements in electric field management.
  • Keywords
    field effect transistors; semiconductor device models; adjacent field plates; arbitrary transition angles; electric field management; field-effect transistors; simplified field plate model; slant field plate model; Capacitance; Electric potential; Insulators; Logic gates; Metals; Permittivity; Transistors; Electric field effects; field-effect transistors (FETs); high-voltage techniques; power semiconductor devices; semiconductor device breakdown; transistors; transistors.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2329475
  • Filename
    6842621