Title :
Thermoelectric thick film patterns formed by using thermally-assisted sputtering method and silicone lift-off masks
Author :
Mizoshiri, Mizue ; Mikami, Masashi ; Ozaki, Koichi ; Shikida, Mitsuhiro ; Hata, Satoshi
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
Abstract :
An increase of film thickness is important for thermoelectric film modules to convert thermal energy into electric energy because the generation power increases with reducing internal resistance of the modules. This article presents a patterning process of thermoelectric thick films using thermally-assisted sputtering method (TASM) and lift-off techniques. Polydimethylsiloxane (PDMS) was used as heat resistant lift-off masks which are needed in TASM. The weight loss of PDMS was as small as 0.5% at 300°C by thermogravimetry analysis. PDMS patterns of lift-off masks with 100 μm height were formed on glass substrates using resist patterns as molds. The substrate temperature reached approximately 300 °C when Bi2Te3 thermoelectric thick films were deposited by TASM. After depositing the films, PDMS lift-off masks which were not melted and significantly non-deformed were removed from the substrates. Bi2Te3 thick film patterns with 300 μm width and 30 μm height were obtained. This patterning process of thick films can be applied to produce thermoelectric thick film generators with high generation power.
Keywords :
bismuth compounds; sputter deposition; thermal analysis; thermoelectric conversion; thermoelectric power; thin films; Bi2Te3; PDMS patterns; TASM; electric energy; film thickness; glass substrates; heat resistant lift-off masks; high generation power; internal resistance; polydimethylsiloxane; resist patterns; silicone lift-off masks; size 100 mum; size 300 mum; substrate temperature; temperature 300 degC; thermal energy; thermally-assisted sputtering method; thermoelectric film modules; thermoelectric thick film deposition; thermoelectric thick film generators; thermoelectric thick film patterns; thermogravimetry analysis; weight loss; Heating; Resistance; Resists; Sputtering; Substrates; Thick films;
Conference_Titel :
Micro-NanoMechatronics and Human Science (MHS), 2013 International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4799-1527-9
DOI :
10.1109/MHS.2013.6710403