Closed-Loop Compensation of Dielectric Charge Induced by Ionizing Radiation

Author

Dominguez-Pumar, Manuel ; Gorreta, Sergi ; Pons-Nin, Joan ; Gomez-Rodriguez, Faustino ; Gonzalez-Castano, Diego M. ; Muschitiello, Michele

Author_Institution

Dept. of Electron. EngineeringMicro & Nano Technol. Group, Univ. Politec. de Catalunya, Barcelona, Spain

Volume

24

Issue

3

fYear

2015

fDate

Jun-15

Firstpage

534

Lastpage

536

Abstract

This letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: without polarization; using an open-loop dielectric charge mitigation strategy; and using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control.

Keywords

capacitors; closed loop systems; compensation; electric charge; ionisation; micromechanical devices; radiation hardening (electronics); MEMS; X-ray irradiation; capacitor; closed-loop compensation; closed-loop control method; dielectric charge control; dielectric charge control loop; gamma-radiation; ionizing radiation; microelectromechanical system; open-loop dielectric charge mitigation strategy; polarization; Capacitance measurement; Dielectrics; Ionizing radiation; Microelectromechanical systems; Micromechanical devices; Radiation effects; X-rays; Dielectric charging control; MEMS reliability; ionizing radiation; ionizing radiation.; radiation effects;

fLanguage

English

Journal_Title

Microelectromechanical Systems, Journal of

Publisher

ieee

ISSN

1057-7157

Type

jour

DOI

10.1109/JMEMS.2015.2428733

Filename

7109101