Title :
Motion estimation of a levitation mechanisms using piezoelectric element
Author :
Sone, Shori ; Torii, Akihiro ; Doki, Kae
Author_Institution :
Dept. of Electr. & Electron. Eng., Aichi Inst. of Technol., Toyota, Japan
Abstract :
We are studying a friction force control mechanism using levitation mechanism. We usually measure levitation height of the levitation mechanisms by the use of a displacement sensor. An inchworm using the levitation mechanisms was proposed, and realized micron order precise displacement over large horizontal working range. An optical fiber displacement sensor used in this research can measure the vertical levitation height but cannot follow the horizontal displacement. Therefore, it is difficult for the displacement sensor to measure the levitation height since the levitation mechanism moves horizontally even though the levitation height is in the vertical direction. We estimate the levitation height by measuring the capacitance between the levitation mechanism and the substrate, which realizes sensorless levitation estimation. The circuit which detects the electric capacitance is a series RC circuit. We apply sine wave AC voltage to the series RC circuit and measure the terminal voltage of the resistance. The estimation method proposed can extend the working range. This paper describes the comparison of the levitation height estimated by the method proposed and one measured by the optical fiber displacement sensor.
Keywords :
fibre optic sensors; force control; friction; height measurement; magnetic levitation; motion estimation; piezoelectric materials; voltage measurement; electric capacitance; friction force control mechanism; inchworm; levitation mechanism; motion estimation; optical fiber displacement sensor; piezoelectric element; realized micron-order precise displacement; sensorless levitation estimation; series RC circuit; sine wave AC voltage; terminal voltage measurement; vertical levitation height measurement; Capacitance; Displacement measurement; Estimation; Levitation; Optical variables measurement; Substrates; Voltage measurement;
Conference_Titel :
Micro-NanoMechatronics and Human Science (MHS), 2013 International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4799-1527-9
DOI :
10.1109/MHS.2013.6710444