DocumentCode
673456
Title
A new approach for in-situ scan impedance characterization of scanned antenna arrays
Author
Christian, Thomas E. ; Hung Loui ; Christodoulou, Christos G. ; Dubbert, Dale F.
Author_Institution
ISR EM & Sensor Tech. Org., Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2013
fDate
7-13 July 2013
Firstpage
304
Lastpage
305
Abstract
Scanned phased array antennas require active scan impedance determination and mitigation. This paper addresses the former by introducing a novel in-situ measurement architecture and associated mathematics for efficiently determining the real-time active scan impedance of arbitrary sized scanned arrays in the field. The in-situ nature of the proposed architecture reduces the need for large numerical simulation and/or estimation of scan impedance variations due to possible diverse antenna array placement in the field. Direct experimental characterization also enables direct validation of numerical simulation. The mathematics developed are for an M by N antenna array utilizing direct in-situ mutual coupling characterization. The mathematical model was implemented in MATLAB and verified through simulation using CST Microwave Studio (MWS) for a 2×2 monopole planar antenna array. The model´s robustness is tested by varying the inter-element spacing.
Keywords
antenna phased arrays; monopole antenna arrays; numerical analysis; planar antenna arrays; CST Microwave Studio; MATLAB; MWS; active scan impedance determination; active scan impedance mitigation; arbitrary sized scanned arrays; direct in-situ mutual coupling characterization; diverse antenna array placement; inter-element spacing; mathematical model; measurement architecture; monopole planar antenna array; numerical simulation; real-time active scan impedance; scanned phased array antennas; Antenna arrays; Antenna measurements; Impedance; Mathematical model; Mutual coupling; Ports (Computers); Reflection coefficient;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location
Orlando, FL
ISSN
1522-3965
Print_ISBN
978-1-4673-5315-1
Type
conf
DOI
10.1109/APS.2013.6710813
Filename
6710813
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