Generalized admittance matrix approach for fast analysis of rotationally symmetric reflector systems with 3D parts

This paper presents a fast full-wave analysis method for rotationally symmetric reflectors including dielectric or metallic 3D parts. The 3D part may be arbitrary waveguide components or support structures as well as non-symmetric subreflectors. The analysis method is based on a domain-decomposition approach that leads to a generalized admittance matrix description of each component in the reflector system.