DocumentCode :
673656
Title :
Analysis of electromagnetic wave radiation from C-slot RFID tag mounted on impedance curved surface using the UTD solution
Author :
Wongsiritorn, Pitchanun ; Phongcharoenpanich, Chuwong ; Pumpoung, Tajchai ; Lertwiriyaprapa, Titipong ; Phaebua, Kittisak
Author_Institution :
Fac. of Eng., King Mongkut´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
fYear :
2013
fDate :
7-13 July 2013
Firstpage :
1076
Lastpage :
1077
Abstract :
The electromagnetic (EM) wave radiation of the C-slot radio frequency identification (RFID) tag located on the impedance surface in this paper is analyzed using the uniform geometrical theory of diffraction (UTD) solution. The UTD radiation solution for the impedance curved surface is employed to predict the EM wave radiation of the RFID tag mounted on the impedance curved product surface. The UTD radiation solution provides the physical insight of the EM field at the observation point and requires less computational time than the other numerical methods. The results show that the UTD radiation solution can accurately predict the radiation pattern of the proposed C-slot RFID tag mounted on the product. The proposed tag antenna can efficiently be applied to the curved surface object, such as the curved metallic product coated with dielectric (layers of paints).
Keywords :
UHF antennas; UHF radio propagation; antenna radiation patterns; electromagnetic fields; electromagnetic wave diffraction; electromagnetic waves; radiofrequency identification; slot antennas; C-slot RFID tag; UTD solution; curved metallic product; curved surface object; dielectric layer; electromagnetic field; electromagnetic wave radiation; impedance curved surface; impedance surface; radiation pattern; radio frequency identification tag; uniform geometrical theory of diffraction; Antenna radiation patterns; Impedance; Radiofrequency identification; Surface impedance; Surface treatment; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location :
Orlando, FL
ISSN :
1522-3965
Print_ISBN :
978-1-4673-5315-1
Type :
conf
DOI :
10.1109/APS.2013.6711198
Filename :
6711198
Link To Document :
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