DocumentCode :
67377
Title :
Generation of Single Input Change Test Sequences for Conformance Test of Programmable Logic Controllers
Author :
Provost, Jean ; Roussel, Jean-Marc ; Faure, Jean-Marc
Author_Institution :
Dept. for Safe Embedded Syst., Tech. Univ. Munchen, Garching, Germany
Volume :
10
Issue :
3
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1696
Lastpage :
1704
Abstract :
Conformance test is a functional test technique which is aiming to check whether an implementation, seen as a black-box with inputs/outputs, conforms to its specification. Numerous theoretical worthwhile results have been obtained in the domain of conformance test of finite state machines. The optimization criterion, which is usually selected to build the test sequence, is the minimum-length criterion. Based on experimental results, this paper focuses on the generation of a single input change (SIC) test sequence from a specification model represented as a Mealy machine; such a sequence is aiming at preventing from erroneous test verdicts due to incorrect detection of synchronous input changes by the programmable logic controller (PLC) under test. A method based on symbolic calculus to obtain the part of the specification that can be tested with a SIC sequence is first presented. Then, an algorithm to build the SIC test sequence is detailed; three solutions are proposed, according to the connectivity properties of the SIC-testable part.
Keywords :
conformance testing; finite state machines; programmable controllers; Mealy machine; PLC; SIC test sequence generation; finite state machines; minimum-length criterion; optimization criterion; programmable logic controller conformance test; single input change test sequences generation; specification model; symbolic calculus; Calculus; Circuit faults; IEC standards; Informatics; Input variables; Silicon carbide; Software; Conformance test; Mealy machine; formal methods; programmable logic controller (PLC); single input change (SIC); test sequence; test verdict;
fLanguage :
English
Journal_Title :
Industrial Informatics, IEEE Transactions on
Publisher :
ieee
ISSN :
1551-3203
Type :
jour
DOI :
10.1109/TII.2014.2315972
Filename :
6784098
Link To Document :
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