• DocumentCode
    67377
  • Title

    Generation of Single Input Change Test Sequences for Conformance Test of Programmable Logic Controllers

  • Author

    Provost, Jean ; Roussel, Jean-Marc ; Faure, Jean-Marc

  • Author_Institution
    Dept. for Safe Embedded Syst., Tech. Univ. Munchen, Garching, Germany
  • Volume
    10
  • Issue
    3
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1696
  • Lastpage
    1704
  • Abstract
    Conformance test is a functional test technique which is aiming to check whether an implementation, seen as a black-box with inputs/outputs, conforms to its specification. Numerous theoretical worthwhile results have been obtained in the domain of conformance test of finite state machines. The optimization criterion, which is usually selected to build the test sequence, is the minimum-length criterion. Based on experimental results, this paper focuses on the generation of a single input change (SIC) test sequence from a specification model represented as a Mealy machine; such a sequence is aiming at preventing from erroneous test verdicts due to incorrect detection of synchronous input changes by the programmable logic controller (PLC) under test. A method based on symbolic calculus to obtain the part of the specification that can be tested with a SIC sequence is first presented. Then, an algorithm to build the SIC test sequence is detailed; three solutions are proposed, according to the connectivity properties of the SIC-testable part.
  • Keywords
    conformance testing; finite state machines; programmable controllers; Mealy machine; PLC; SIC test sequence generation; finite state machines; minimum-length criterion; optimization criterion; programmable logic controller conformance test; single input change test sequences generation; specification model; symbolic calculus; Calculus; Circuit faults; IEC standards; Informatics; Input variables; Silicon carbide; Software; Conformance test; Mealy machine; formal methods; programmable logic controller (PLC); single input change (SIC); test sequence; test verdict;
  • fLanguage
    English
  • Journal_Title
    Industrial Informatics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1551-3203
  • Type

    jour

  • DOI
    10.1109/TII.2014.2315972
  • Filename
    6784098