Title : 
Investigating Mobile Device Picking-up motion as a novel biometric modality
         
        
            Author : 
Tao Feng ; Xi Zhao ; Weidong Shi
         
        
            Author_Institution : 
Comput. Sci. Dept., Univ. of Houston, Houston, TX, USA
         
        
        
            fDate : 
Sept. 29 2013-Oct. 2 2013
         
        
        
        
            Abstract : 
Employing mobile sensor data to recognize user behavioral activities has been well studied in recent years. However, exploiting mobile motion data as a novel biometric modality remains a new area. In this paper, we propose two novel methods, a Statistic Method to intuitively apply classifier on the statistic features of the data; and a Trajectory Reconstruction Method to reconstruct the Mobile Device Picking-up(MDP) motion trajectories and extract specific identity features from the traces. We evaluated our methods on a multi-session motion dataset. A Equal Error Rate of 6.13% and 7.09% has been respectively achieved by the Statistic Method and the Trajectory Reconstruction Method, which demonstrated the feasibility of the proposed methods. Furthermore, experimental results showed several interesting evidences: 1) the accuracy of the methods declined in the inter-session tests; and 2) user movements(e.g., walking) have a high impact on the verification performance.
         
        
            Keywords : 
feature extraction; gesture recognition; image reconstruction; motion estimation; statistical analysis; MDP motion trajectories; equal error rate; feature extraction; inter-session tests; mobile device picking-up motion trajectory; mobile sensor data; multisession motion dataset; novel biometric modality; statistic method; trajectory reconstruction method; user behavioral activities; Acceleration; Feature extraction; Mobile communication; Mobile handsets; Motion segmentation; Noise; Trajectory;
         
        
        
        
            Conference_Titel : 
Biometrics: Theory, Applications and Systems (BTAS), 2013 IEEE Sixth International Conference on
         
        
            Conference_Location : 
Arlington, VA
         
        
        
            DOI : 
10.1109/BTAS.2013.6712701