• DocumentCode
    674334
  • Title

    Finite element analysis for distribution of surface charge on current-carrying conductor

  • Author

    Suk Min Hong ; Il Han Park

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2013
  • fDate
    26-29 Oct. 2013
  • Firstpage
    868
  • Lastpage
    872
  • Abstract
    The purpose of this paper is to analyze distribution of surface charge density on DC-carrying conductor. A new numerical analysis method, based on finite element method, is proposed in this paper. Basically the method consists of two steps: first is to calculate inside field of conductor and second is to calculate outside field. Knowing the charge distribution on the conductor surface helps better understanding of the current in conductor and will be useful for extracting parasitic circuit parameters and modeling on-chip interconnects etc.
  • Keywords
    conductors (electric); finite element analysis; surface charging; current-carrying conductor; finite element analysis; on-chip interconnect modeling; surface charge distribution; Atmospheric modeling; Conductors; Electric fields; Electrodes; Finite element analysis; Wires; Conductor; finite element method; parasitic circuit parameter; surface charge density;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems (ICEMS), 2013 International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4799-1446-3
  • Type

    conf

  • DOI
    10.1109/ICEMS.2013.6713136
  • Filename
    6713136