DocumentCode :
67437
Title :
Multi-Loaded Modulated Scatterer Technique for Sensing Applications
Author :
Capdevila, S. ; Jofre, Lluis ; Romeu, Jordi ; Bolomey, J.C.
Author_Institution :
Signal Theor. & Commun. Dept, Univ. Politcnica de Catalunya, Barcelona, Spain
Volume :
62
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
794
Lastpage :
805
Abstract :
Modulated scatterer technique (MST) probes have been commonly used for near-field mapping application in antenna measurements as well as in imaging applications. Although they can be used as a general sensor, they present limitations in the amount of information that can be obtained. The paper proposes a new configuration for MST probes that can be used for sensing applications, which consists in using a set of impedances (at least three different impedances) instead of the conventional two impedance loads. Additional sensitive loads, such as thermistors, can be added to the multi-load MST sensor, in order to remotely sense their variation and perform further sensing of parameters which could not always be sensed by conventional MST. The paper presents the formulation and approaches that can be used to exploit the sensing capabilities of such multi-loaded MST sensor, as well as experimental validations through the measurement of the temperature in the neighborhood of the sensor.
Keywords :
antennas; electromagnetic wave scattering; modulation; sensors; antenna measurements; impedance load; multiloaded modulated scatterer technique; near field mapping application; sensing applications; sensitive load; Antenna measurements; Impedance; Loaded antennas; Probes; Sensors; Temperature measurement; Antennas; antenna measurements; electromagnetic scattering; impedance; modulated scatterer technique (MST); probes; radio frequency identification (RFID); scattering cross section; thermistors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2240913
Filename :
6469221
Link To Document :
بازگشت