DocumentCode :
67467
Title :
Multichannel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements
Author :
Scandurra, Graziella ; Giusi, Gino ; Ciofi, Carmine
Author_Institution :
Dipt. di Ing. Elettron., Chim. e Ing. Ind., Univ. of Messina, Messina, Italy
Volume :
62
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1145
Lastpage :
1153
Abstract :
In this paper, we discuss a few techniques that allow an effective reduction of the background noise and/or the reduction of the measurement time when performing voltage noise measurements by employing a number of nominally identical voltage amplifiers with negligible equivalent input current noise. It is demonstrated in particular that, if N (N > 2) voltage amplifiers are connected to the device under test and if the properties of cross-correlation among all N acquisition channels connected to the output of each amplifier are exploited, the time required for obtaining a given accuracy is reduced by a factor N(N - 1)/2 with respect to the conventional setup for cross-correlation that employs only two channels. From another point of view, the effective background noise is reduced for constant measurement time. Such a factor can be further increased if amplifier paralleling is also employed for reducing the equivalent input voltage noise for each channel. Measurements on two different setups employing up to four channels and up to eight channels are presented that confirm the expected reduction factors in measurement times.
Keywords :
amplifiers; noise measurement; sensitivity; time measurement; voltage measurement; N acquisition channels; amplifier paralleling; background noise; equivalent input current noise; high-sensitivity; identical voltage amplifiers; multichannel amplifier topology; time measurement reduction; voltage noise measurement; Frequency measurement; Impedance; Noise; Noise measurement; Silicon compounds; Time measurement; Voltage measurement; Amplifier noise; amplifiers; correlation; noise measurements; spectral analysis;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2012.2236719
Filename :
6469224
Link To Document :
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