DocumentCode :
67595
Title :
Visible Light-Emitting Diodes With Thin-Film-Flip- Chip-Based Wafer-Level Chip-Scale Package Technology Using Anisotropic Conductive Film Bonding
Author :
Keon Hwa Lee ; Seung Hwan Kim ; Woo-Sik Lim ; June-O Song ; Jae-Hyun Ryou
Author_Institution :
Dept. of LED Bus., LG Innotek Co., Ltd., Paju, South Korea
Volume :
36
Issue :
7
fYear :
2015
fDate :
Jul-15
Firstpage :
702
Lastpage :
704
Abstract :
Demonstrated is advanced device and packaging architecture of visible GaN-based light-emitting diodes (LEDs) combining thin-film flip-chip devices and wafer-level chip-scale package with through-silicon-via (TSV) and wafer-to-wafer alignment bonding. In addition, a new interconnect technique for LEDs is introduced using an anisotropic conductive film with metal balls. Thermal rollover in light output versus current characteristics is not observed up to 700 mA. A forward voltage at 350 mA is 3.06 V. The architecture can facilitate excellent heat removal through a TSV-formed Si wafer in addition to expected benefits of easy integration of Si-based devices in lighting modules. Light-output power at 350 mA increases by 11.1% compared with that of conventional flip-chip LEDs. A Lambertian-like emission pattern is also achieved.
Keywords :
III-V semiconductors; chip scale packaging; elemental semiconductors; flip-chip devices; gallium compounds; light emitting diodes; silicon; three-dimensional integrated circuits; wafer level packaging; GaN; LED; Lambertian-like emission pattern; Si; TSV-formed Si wafer; anisotropic conductive film bonding; current 350 mA; heat removal; interconnect technique; lighting modules; metal balls; thermal rollover; thin-film flip-chip devices; through-silicon-via; visible GaN-based light-emitting diodes; voltage 3.06 V; wafer-level chip-scale package; wafer-to-wafer alignment bonding; Bonding; Flip-chip devices; Light emitting diodes; Metals; Packaging; Silicon; Substrates; Anisotropic conductive film (ACF); anisotropic conductive film (ACF); light-emitting diodes (LEDs); thin film flip chip (TFFC); through-silicon via (TSV); wafer-level chip-scale package (WLCSP);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2434053
Filename :
7109148
Link To Document :
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