• DocumentCode
    6764
  • Title

    Functional Broadside Templates for Low-Power Test Generation

  • Author

    Pomeranz, Irith

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    21
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    2321
  • Lastpage
    2325
  • Abstract
    This brief describes a new approach to low-power test generation targeting the maximum switching activity during the fast functional clock cycles of broadside tests. This brief defines functional broadside templates as incompletely-specified broadside tests, which capture the signal-transitions that occur during the fast functional clock cycles of functional broadside tests. The same signal-transitions can occur during functional operation. Therefore, functional broadside templates can guide the generation of low-power test sets when the goal is to match the power dissipation that is possible during functional operation on a line-by-line basis. This brief describes a procedure for computing functional broadside templates from completely-specified functional broadside tests, and a low-power test generation procedure for transition faults based on templates.
  • Keywords
    circuit testing; clocks; fault tolerance; low-power electronics; fast functional clock cycles; functional broadside templates; low-power test generation; maximum switching activity; signal-transitions; transition faults; Benchmark testing; Circuit faults; Clocks; Computational modeling; Power dissipation; Switches; Very large scale integration; Functional broadside tests; low-power tests; scan circuits; test generation; transition faults;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2228510
  • Filename
    6409490