DocumentCode :
678764
Title :
Functional verification of complete sequential behaviors: A formal treatment of discrepancies between system-level and RTL descriptions
Author :
Castro Marquez, Carlos Ivan ; Strum, Marius ; Wang Jiang Chau
Author_Institution :
Dept. of Electron. Syst., Univ. of Sao Paulo, Sao Paulo, Brazil
fYear :
2013
fDate :
16-18 Dec. 2013
Firstpage :
1
Lastpage :
6
Abstract :
Formal techniques allow exhaustive verification on circuit design (at least in theory), but due to actual computational limitations, workarounds must always be adopted to check only a portion of the design at a time. Sequential equivalence checking is an effective approach, but it can only be applied between circuit descriptions where a one-to-one correspondence for states, as well as for memory elements, is expected. This paper presents a formal methodology to verify RTL descriptions through direct comparison with high-level reference models. By doing so, there is no need to specify or analyze formal properties, as the complete behavior is already contained in the reference model. We also consider the natural discrepancies between system level and RTL code, including non-matching interface and memory elements, and state mapping. In this manner, we are able to prove the functional coherence for the overall sequential behavior of the design under verification.
Keywords :
digital circuits; finite state machines; formal verification; hardware description languages; high level synthesis; RTL descriptions; circuit design; complete sequential behaviors; design under verification; exhaustive verification; formal methodology; functional coherence; functional verification; high level reference models; memory elements; sequential equivalence checking; system level descriptions; Automata; Complexity theory; Computational modeling; Concurrent computing; Data models; Integrated circuit modeling; Model checking; Formal RTL validation; finite state machine with data; process concurrency; reference model; state sequence coverage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Test Symposium (IDT), 2013 8th International
Conference_Location :
Marrakesh
Type :
conf
DOI :
10.1109/IDT.2013.6727074
Filename :
6727074
Link To Document :
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