• DocumentCode
    67955
  • Title

    Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails

  • Author

    Inyong Kwon ; Seongjong Kim ; Fick, D. ; Myungbo Kim ; Yen-Po Chen ; Sylvester, D.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    49
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    2054
  • Lastpage
    2066
  • Abstract
    This paper presents Razor-Lite, which is a low-overhead register for use in error detection and correction (EDAC) systems. These systems are able to eliminate timing margins by using specialized registers to detect setup time violations. However, these EDAC registers incur significant area and energy overheads, which mitigates some the system benefits. Razor-Lite is a new EDAC register that addresses this issue by adding only 8 additional transistors to a conventional flip-flop design. The Razor-Lite flip-flop achieves low overhead via a charge-sharing technique that attaches to a standard flip-flop without modifying its design. Side-channels connected to the floating nodes generate error flags through simple logic gates totaling 8 transistors, enabling register energy/area overheads of 2.7%/33% over a conventional DFF, while also not incurring extra clock or datapath loading or delay. Razor-Lite is demonstrated in a 7-stage Alpha architecture processor in a 45nm SOI CMOS technology with a measured energy improvement of 83% while incurring a 4.4% core area overhead compared to a baseline design.
  • Keywords
    CMOS integrated circuits; error correction; error detection; flip-flops; silicon-on-insulator; EDAC register; EDAC systems; Razor-Lite flip-flop; SOI CMOS technology; alpha architecture processor; charge-sharing technique; error detection and correction systems; flip-flop design; light-weight register; low-overhead register; virtual supply rails; Clocks; Delays; Inverters; Monitoring; Rails; Registers; Adaptive circuits; CMOS; Razor; dynamic voltage and frequency scaling (DVFS); error detection and correction (EDAC); integrated circuits; timing speculation; variation tolerance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2328658
  • Filename
    6842679