DocumentCode :
67955
Title :
Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails
Author :
Inyong Kwon ; Seongjong Kim ; Fick, D. ; Myungbo Kim ; Yen-Po Chen ; Sylvester, D.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume :
49
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
2054
Lastpage :
2066
Abstract :
This paper presents Razor-Lite, which is a low-overhead register for use in error detection and correction (EDAC) systems. These systems are able to eliminate timing margins by using specialized registers to detect setup time violations. However, these EDAC registers incur significant area and energy overheads, which mitigates some the system benefits. Razor-Lite is a new EDAC register that addresses this issue by adding only 8 additional transistors to a conventional flip-flop design. The Razor-Lite flip-flop achieves low overhead via a charge-sharing technique that attaches to a standard flip-flop without modifying its design. Side-channels connected to the floating nodes generate error flags through simple logic gates totaling 8 transistors, enabling register energy/area overheads of 2.7%/33% over a conventional DFF, while also not incurring extra clock or datapath loading or delay. Razor-Lite is demonstrated in a 7-stage Alpha architecture processor in a 45nm SOI CMOS technology with a measured energy improvement of 83% while incurring a 4.4% core area overhead compared to a baseline design.
Keywords :
CMOS integrated circuits; error correction; error detection; flip-flops; silicon-on-insulator; EDAC register; EDAC systems; Razor-Lite flip-flop; SOI CMOS technology; alpha architecture processor; charge-sharing technique; error detection and correction systems; flip-flop design; light-weight register; low-overhead register; virtual supply rails; Clocks; Delays; Inverters; Monitoring; Rails; Registers; Adaptive circuits; CMOS; Razor; dynamic voltage and frequency scaling (DVFS); error detection and correction (EDAC); integrated circuits; timing speculation; variation tolerance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2328658
Filename :
6842679
Link To Document :
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