DocumentCode
67955
Title
Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails
Author
Inyong Kwon ; Seongjong Kim ; Fick, D. ; Myungbo Kim ; Yen-Po Chen ; Sylvester, D.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume
49
Issue
9
fYear
2014
fDate
Sept. 2014
Firstpage
2054
Lastpage
2066
Abstract
This paper presents Razor-Lite, which is a low-overhead register for use in error detection and correction (EDAC) systems. These systems are able to eliminate timing margins by using specialized registers to detect setup time violations. However, these EDAC registers incur significant area and energy overheads, which mitigates some the system benefits. Razor-Lite is a new EDAC register that addresses this issue by adding only 8 additional transistors to a conventional flip-flop design. The Razor-Lite flip-flop achieves low overhead via a charge-sharing technique that attaches to a standard flip-flop without modifying its design. Side-channels connected to the floating nodes generate error flags through simple logic gates totaling 8 transistors, enabling register energy/area overheads of 2.7%/33% over a conventional DFF, while also not incurring extra clock or datapath loading or delay. Razor-Lite is demonstrated in a 7-stage Alpha architecture processor in a 45nm SOI CMOS technology with a measured energy improvement of 83% while incurring a 4.4% core area overhead compared to a baseline design.
Keywords
CMOS integrated circuits; error correction; error detection; flip-flops; silicon-on-insulator; EDAC register; EDAC systems; Razor-Lite flip-flop; SOI CMOS technology; alpha architecture processor; charge-sharing technique; error detection and correction systems; flip-flop design; light-weight register; low-overhead register; virtual supply rails; Clocks; Delays; Inverters; Monitoring; Rails; Registers; Adaptive circuits; CMOS; Razor; dynamic voltage and frequency scaling (DVFS); error detection and correction (EDAC); integrated circuits; timing speculation; variation tolerance;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2014.2328658
Filename
6842679
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