A fast method for obtaining active S-parameters in large uniform phased array antennas

An accelerated method for characterizing active reflection coefficients in electrically large uniform active phased arrays is presented. The proposed method only requires the S-parameters related to the center and few edge elements, which dramatically reduces the total number of measurements to be performed with a 2-port vector network analyzer (VNA). The results obtained with the proposed method are compared to HFSS and measurement results for two tapered slot antenna (TSA) arrays.