• DocumentCode
    679943
  • Title

    A silicon based surface micro-machined distributed Bragg reflector for MEMS spectroscopic applications

  • Author

    Tripathi, Dhirendra Kumar ; Silva, K. K. M. B. Dilusha ; Rafiei, Ramin ; Bumgarner, J.W. ; Martyniuk, M. ; Nguyen, Thin ; Antoszewski, J. ; Dell, J.M. ; Faraone, L.

  • Author_Institution
    Sch. of Electr. Electron. & Comput. Eng., Univ. of Western Australia, Crawley, WA, Australia
  • fYear
    2013
  • fDate
    17-20 Dec. 2013
  • Firstpage
    289
  • Lastpage
    293
  • Abstract
    While optical spectral analysis has shown great promise in industrial and agricultural applications, the cost, size, and fragility of spectrometer instruments have hindered widespread application of the technology. MEMS microspectrometers offer great hope for low-cost, light-weight, robust, spectrometers, paving the way for pervasive use of infrared spectroscopy in agriculture. In the past, germanium based microspectrometers have been successfully demonstrated in the shortwave infrared and midwave infrared spectral ranges. How-ever, high absorption in the germanium has prevented operation of these microspectrometers in the near-infrared and visible wavelengths. We present here a silicon based surface micro-machined distributed Bragg reflector, for short wave infrared wavelengths, suited to MEMS spectrometer fabrication, with near ideal reflectance properties.
  • Keywords
    Bragg gratings; elemental semiconductors; germanium; infrared spectrometers; micro-optics; reflectivity; silicon; visible spectrometers; Ge; MEMS spectroscopic applications; Si; midwave infrared spectral ranges; optical spectral analysis; reflectance; shortwave infrared spectral ranges; silicon based surface micromachined distributed Bragg reflector; Absorption; Germanium; Integrated optics; Micromechanical devices; Mirrors; Optical device fabrication; Silicon; Bragg reflec-tor; Microelectromechanical systems; germanium; optical spectra; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Information Systems (ICIIS), 2013 8th IEEE International Conference on
  • Conference_Location
    Peradeniya
  • Print_ISBN
    978-1-4799-0908-7
  • Type

    conf

  • DOI
    10.1109/ICIInfS.2013.6731997
  • Filename
    6731997