• DocumentCode
    680647
  • Title

    Bacterial immobilization and detection using porous silicon platform and CMOS sensory circuit

  • Author

    Hajj-Hassan, Mohamad ; Harb, Atef ; Hajj-Hassan, Houssein

  • Author_Institution
    Dept. of Biomed. Eng., Lebanese Int. Univ., Beirut, Lebanon
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The paper presents the design of MEMS-based sensory system for real-time bacteria detection. The principle of functioning is based on monitoring the variation in capacitance signals owing to the adherence of target bacteria to the sensing interface. The system is designed using custom-based technology and it consists of comb finger capacitor structures made out of doped polysilicon. Aiming at improving the detection efficiency, the space between the comb fingers, forming the two electrodes of the capacitive sensor, will be made porous through a post-processing with Xenon Difluoride (XeF2) dry etching technique. This allows entrapping bacteria in between the electrodes thus increasing the variation of capacitance. This latter, is acquired using a Charge Based Capacitance Measurement (CBCM) sensory circuit built with to the 0.13 μm CMOS technology. The circuit is able to detect a difference in capacitance as low as 0.75 fF.
  • Keywords
    CMOS integrated circuits; biosensors; capacitance measurement; elemental semiconductors; etching; microorganisms; microsensors; porous semiconductors; silicon; xenon compounds; CMOS sensory circuit; MEMS-based sensory system; Si; XeF2; bacterial immobilization; capacitance signals; charge based capacitance measurement; comb finger capacitor structures; porous silicon platform; real-time bacteria detection; size 0.13 mum; target bacteria adherence; xenon difluoride dry etching technique; Biology; CMOS integrated circuits; CMOS technology; Capacitance; Micromechanical devices; Monitoring; Sensors; CMOS technology; Porous silicon; bacteria detection; capacitive sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (ICM), 2013 25th International Conference on
  • Conference_Location
    Beirut
  • Print_ISBN
    978-1-4799-3569-7
  • Type

    conf

  • DOI
    10.1109/ICM.2013.6735006
  • Filename
    6735006