Title :
Self-organized reliability suitable for Wireless Networked MPSoC
Author :
Heil, M. ; Tanougast, Camel ; Killian, Cedric ; Dandache, A.
Author_Institution :
Univ. de Lorraine, Metz, France
Abstract :
This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.
Keywords :
Zigbee; integrated circuit reliability; network-on-chip; telecommunication network reliability; NoC; ZigBee wireless communication; error detection; error localization; network-on-chip; offline test mechanism; self-organized reliability technique; wireless multinode system; wireless networked MPSoC; Ad hoc networks; Estimation; Switches; Timing; Wireless communication; Wireless sensor networks; Zigbee;
Conference_Titel :
Microelectronics (ICM), 2013 25th International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4799-3569-7
DOI :
10.1109/ICM.2013.6735020