DocumentCode :
68073
Title :
Watermarking in Hard Intellectual Property for Pre-Fab and Post-Fab Verification
Author :
Saha, Debasri ; Sur-Kolay, Susmita
Author_Institution :
A.K. Choudhury Sch. of Inf. Technol., Univ. of Calcutta, Kolkata, India
Volume :
23
Issue :
5
fYear :
2015
fDate :
May-15
Firstpage :
801
Lastpage :
809
Abstract :
A manufacture-ready layout is vulnerable to misappropriation when it is either fabricated as a chip in a fabrication facility, or reused in a system-on-chip house. We propose an intellectual property protection (IPP) scheme IPP_MRL for protection of manufacture-ready layout against unauthorized reuse and inclusion of Trojans. The IPP_MRL inserts watermarks in the layout according to designer´s signature with an effect of tuning the delays at selected scan flip-flops. Certain dummy fills are reoriented in the neighborhood of selected net segments and it causes fine tuning of delay; certain other selected net segments are resized for coarse change in delay. The IPP_MRL not only verifies the watermark in the layout, but also captures its effect as delay fault-induced responses from the packaged chips, fabricated from the watermarked layout, by applying a faster test clock. Due to the controlled effect of watermarking on delay, responses are resilient against process and temperature variation, but capable of detecting hardware Trojan. The method is adaptive to device aging. The results for ISCAS´85 and ISCAS´89 benchmark circuits show that the overhead of watermarking on circuit delay is less than 0.05% and the probability of true false or false true can be at most ~10-6.
Keywords :
flip-flops; integrated circuit layout; invasive software; microprocessor chips; watermarking; IPP scheme; IPP-MRL; Trojans inclusion; circuit delay; delay fault-induced responses; device aging; dummy fills; hardware Trojan; intellectual property protection scheme; manufacture-ready layout protection; net segments; packaged chips; scan flip-flops; system-on-chip house; test clock; unauthorized reuse; watermarks; Clocks; Delays; Hardware; Layout; Robustness; Trojan horses; Watermarking; Area fill synthesis; delay fault testing; intellectual property protection (IPP); watermarking; wire sizing; wire sizing.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2322138
Filename :
6842690
Link To Document :
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