DocumentCode
681234
Title
[Front matter]
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
1
Lastpage
7
Abstract
The following topics are dealt with: system calibration; RF device modeling & linearization; loadpull; measurement systems; on-wafer measurements; and interactive forum.
Keywords
calibration; measurement systems; microwave measurement; semiconductor device models; RF device linearization; RF device modeling; interactive forum; loadpull; measurement systems; on-wafer measurements; system calibration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/ARFTG-2.2013.6737333
Filename
6737333
Link To Document