DocumentCode :
681247
Title :
2013 IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems (CATCON) [Copyright notice]
fYear :
2013
fDate :
6-8 Dec. 2013
Firstpage :
1
Lastpage :
1
Abstract :
Copyright ©2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Copyright and Reprint Permission: Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of U.S. copyright law for private use of patrons those articles in this volume that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923. For other copying, reprint or republication permission, write to IEEE Copyrights Manager, IEEE Operations Center, 445 Hoes Lane, Piscataway, NJ 08854. All rights reserved. Copyright ©2013 by IEEE. IEEE Catalog Number: CFP1320V-ART. ISBN : 978-1-4799-0083-1.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Assessment Techniques in Electrical Systems (CATCON), 2013 IEEE 1st International Conference on
Conference_Location :
Kolkata, India
Print_ISBN :
978-1-4799-0081-7
Type :
conf
DOI :
10.1109/CATCON.2013.6737462
Filename :
6737462
Link To Document :
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