DocumentCode
681335
Title
How reliable is smartness? And how smart is reliability?
Author
Lee, W.K.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear
2013
fDate
19-20 Aug. 2013
Firstpage
381
Lastpage
384
Abstract
This paper highlights major reliability concerns in the trend of building smartness in everything from devices to systems. It alerts engineers to determine the trade-off equilibrium of new smartness in a more practical and realistic manner. The discussion is based on several common roles of smart practices that include software; driver; and redundancy. The major concerns are expressed in five areas: series reliability shrinkage; cold standby´s intrinsic imperfection; crossroad & roundabout jeopardy; software unreliability and cyber vulnerability.
Keywords
software reliability; cold standby intrinsic imperfection; crossroad jeopardy; cyber vulnerability; reliability concerns; roundabout jeopardy; series reliability; smart practices; software unreliability; trade-off equilibrium; Cold Standby; Redundancy; Reliability; Smart City; Smart Grid;
fLanguage
English
Publisher
iet
Conference_Titel
Smart and Sustainable City 2013 (ICSSC 2013), IET International Conference on
Conference_Location
Shanghai
Electronic_ISBN
978-1-84919-707-6
Type
conf
DOI
10.1049/cp.2013.1964
Filename
6737856
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