DocumentCode :
681335
Title :
How reliable is smartness? And how smart is reliability?
Author :
Lee, W.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
19-20 Aug. 2013
Firstpage :
381
Lastpage :
384
Abstract :
This paper highlights major reliability concerns in the trend of building smartness in everything from devices to systems. It alerts engineers to determine the trade-off equilibrium of new smartness in a more practical and realistic manner. The discussion is based on several common roles of smart practices that include software; driver; and redundancy. The major concerns are expressed in five areas: series reliability shrinkage; cold standby´s intrinsic imperfection; crossroad & roundabout jeopardy; software unreliability and cyber vulnerability.
Keywords :
software reliability; cold standby intrinsic imperfection; crossroad jeopardy; cyber vulnerability; reliability concerns; roundabout jeopardy; series reliability; smart practices; software unreliability; trade-off equilibrium; Cold Standby; Redundancy; Reliability; Smart City; Smart Grid;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Smart and Sustainable City 2013 (ICSSC 2013), IET International Conference on
Conference_Location :
Shanghai
Electronic_ISBN :
978-1-84919-707-6
Type :
conf
DOI :
10.1049/cp.2013.1964
Filename :
6737856
Link To Document :
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