DocumentCode
681470
Title
Architecture of pipelined MBISTs and its configuration in complex SoC
Author
Zakaria, N.A. ; Noor, Nur Qamarina Mohd ; Rani, Muhamad Khairol Ab
Author_Institution
Dept. of Integrated Circuit Dev., MIMOS Berhad, Bukit Jalil, Malaysia
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
138
Lastpage
143
Abstract
In addressing the problem of area overhead, physical routing and timing management between memory built-in self-tests (MBISTs) controllers with hundreds of embedded memories in system on Chip (SoC), various approaches have been proposed. In addressing these problems, MBISTs structure and architectural design should be efficiently determined in detail so that the problems associated with the issues mentioned can be addressed. In the present paper, the inclusion of pipeline registers in MBIST is done automatically at the RTL level, and there are a number of measures discussed to produce a suitable structure for SoC designs. In order to test the 150 embedded memories in the WiMAX SoC as a case study, a total of 20 pipelined MBISTs are designed. MBIST is allocated by reference to its frequency, location, and type of memories. This paper presents the methodology to propose suitable architecture for WiMAX SoC with 20 MBIST controllers. All 20 MBISTs were synthesized together with a gate level netlist of WiMAX SoC using 90nm process technology. Results show a reduction in terms of area by about 3953 μm2, net switching power about 3 mW, and simulation time of about 3689 μs compared to the first proposed architecture.
Keywords
WiMax; built-in self test; flip-flops; memory architecture; pipeline processing; system-on-chip; MBIST controllers; RTL level; SoC designs; WiMAX SoC; embedded memories; gate level netlist; memory built-in selftests; pipeline registers; pipelined MBIST architecture; power 3 mW; system on chip; time 3689 mus; Built-in self-test; Digital signal processing; Pipeline processing; Pipelines; Registers; System-on-chip; WiMAX; dual-port memory; dual-port register file; memory built-in self test; pipeline register;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ISIEA), 2013 IEEE Symposium on
Conference_Location
Kuching
Print_ISBN
978-1-4799-1124-0
Type
conf
DOI
10.1109/ISIEA.2013.6738983
Filename
6738983
Link To Document