DocumentCode :
681471
Title :
CADENCE simulation studies on the effect of transistor width size on internal resistance in CMOS rectifier using two PMOS and NMOS
Author :
Raop, Mohd Azril Ab ; Radzuan, Roskhatijah ; Hamzah, Mustafar Kamal ; Salleh, M.K.M. ; Baharom, Rahimi
Author_Institution :
Fac. of Electr. Eng., MARA Univ. of Technol., Shah Alam, Malaysia
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
144
Lastpage :
147
Abstract :
This paper presents studies on the effects of the transistor width size on internal resistance in CMOS rectifier using two PMOS and NMOS configurations. The minimum value of 4 μm widths size of MOSFET in CMOS Rectifier are applied up to maximum value of 1500 μm. The proposed work was designed, modelled and simulated using CADENCE software. The best configuration of the width size on the PMOS and NMOS internal resistance are represented with the lowest internal resistance possible for miniaturizing the CMOS Rectifier. The simulation results are presented to verify the proposed configurations.
Keywords :
CMOS integrated circuits; MOSFET; circuit simulation; rectifiers; CADENCE simulation; CMOS rectifier; NMOS configuration; PMOS configuration; internal resistance; transistor width size effect; CMOS integrated circuits; Immune system; MOSFET; Rectifiers; Resistance; AC to DC converter; CMOS Rectifier; MOSFET width size; internal resistance of transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ISIEA), 2013 IEEE Symposium on
Conference_Location :
Kuching
Print_ISBN :
978-1-4799-1124-0
Type :
conf
DOI :
10.1109/ISIEA.2013.6738984
Filename :
6738984
Link To Document :
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