• DocumentCode
    682182
  • Title

    Transfer function calibration of LEMP electric field intrument based on bounded wave simulator

  • Author

    Jiang Zhidong ; Zhou Bihua ; Xu Yun

  • Author_Institution
    Nat. Key Lab. on Electromagn. Environ. & electro-Opt. Eng., PLA Univ. of Sci. & Technol., Nanjing, China
  • Volume
    1
  • fYear
    2013
  • fDate
    16-19 Aug. 2013
  • Firstpage
    422
  • Lastpage
    426
  • Abstract
    Lightning fields are commonly obtained by integrating the output of antennas that produce replicas of the derivatives of the wanted quantities. The integration is carried out using RC integral circuits that introduce a distortion in the form of a decay time constant that may affect the response of the LEMP electric field sensor. As the decay time constant demonstrate different feature of the electric field instrument, we present a method for transfer function calibration of LEMP electric field instrument. Combine with the 1.2/50μs excitation pulse source and bounded wave simulator, experimental validation is carried by using the transfer function for compensating the response of the LEMP electric field sensor. Finally, this method is applied to observational data of an IC flash.
  • Keywords
    RC circuits; antennas; calibration; distortion; electric field measurement; electric sensing devices; electromagnetic fields; electromagnetic pulse; lightning; transfer functions; IC flash; LEMP electric field instrument; LEMP electric field sensor; RC integral circuits; antennas; bounded wave simulator; decay time constant; distortion; excitation pulse source; lightning electromagnetic field; time 1.2 mus to 50 mus; transfer function calibration; Calibration; Electric fields; Electric variables measurement; Instruments; Lightning; Magnetic field measurement; Transfer functions; LEMP electric field instrument; Transfer function calibration; bounded wave simulator; system identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-0757-1
  • Type

    conf

  • DOI
    10.1109/ICEMI.2013.6743014
  • Filename
    6743014