Title :
Reducing lead-free soldering failures caused by Printed Circuit Board shrinkage
Author :
Geczy, Attila ; Tersztyanszky, Laszlo ; Illes, Balazs ; Kemler, Andras ; Szabo, Aron
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
Abstract :
The paper presents a novel approach on an emerging problem in lead-free reflow soldering technology. The trend of miniaturized SMD device application and the increasing component density cause newfound problems during the reflow process. In this work, the issue of Printed Circuit Board (PCB) shrinkage is inspected in the environment of automotive electronics production. The shrinkage effect results in linear offset on the double sided PCB along the (XY) dimensions during stencil printing of the second reflow pass. The observed phenomenon causes tombstone and bridging failures on specific fine-pitch SMD components. To investigate and obtain deeper understanding of the phenomenon, a new method was developed for the measurement of shrinkage. The novel measurement method is evaluated with a less-productive, but more precise measurement device. With the collected data it is possible to approximate the overall shrinkage of the given product. After introducing a compensation step on the stencil design (based on the measurements), it is possible to significantly reduce the quantity of failures caused by the shrinkage.
Keywords :
failure analysis; fine-pitch technology; inspection; printed circuit testing; reflow soldering; surface mount technology; SMD device; automotive electronics; bridging failures; fine-pitch SMD components; lead-free reflow soldering technology; printed circuit board shrinkage; stencil design; stencil printing; Cooling; Lead; Printed circuits; Printing; Size measurement; Soldering; Printed circuit board; automotive electronics; bridging; shrinkage; tombstone;
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2013 IEEE 19th International Symposium for
Conference_Location :
Galati
DOI :
10.1109/SIITME.2013.6743645