DocumentCode :
682899
Title :
Current-voltage characteristics of novel PV devices under various irradiance and temperature conditions
Author :
Hishikawa, Yoshihiro ; Tobita, Hiromi ; Sasaki, A. ; Yamagoe, Kengo ; Onuma, T. ; Tsuno, Yuki
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1417
Lastpage :
1422
Abstract :
The current voltage (I-V) characteristics of PV devices under various irradiance, temperature, and spectral conditions are of central importance for evaluating the output power and energy production of the devices under various climate conditions. Those characteristics are relatively well confirmed for crystalline silicon and thin film Si PV devices, and methods to estimate the irradiance-dependence and temperature-dependence are described in standards such as IEC60891. However, experimental results on newer devices such as CIGS, dye-sensitized (DSC), and organic thin film (OPV) devices are less established than those Si based PV devices. The present study extensively investigates the I-V curves of those novel PV cells and modules under various irradiance and temperature conditions. It is shown that the resultant irradiance dependence at 0.01-1 sun is predominantly affected by the series resistance, which is consistent with the precedent reports on PV modules. The temperature dependence is dominated by the constituent photovoltaic materials and structure. Translation equations for irradiance and temperature based on linear interpolation are applicable also to the new PV devices.
Keywords :
elemental semiconductors; interpolation; semiconductor thin films; silicon; solar cells; thin film devices; CIGS; DSC device; I-V characteristics; OPV device; PV module; Si; climate condition; crystalline silicon; current-voltage characteristics; dye-sensitized device; irradiance-dependence condition; linear interpolation; organic thin film device; photovoltaic material; photovoltaic structure; spectral condition; temperature-dependence condition; thin film PV device; translation equations; Interpolation; Performance evaluation; Photovoltaic systems; Silicon; Sun; Temperature measurement; energy rating; irradiance; performance; temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744409
Filename :
6744409
Link To Document :
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