DocumentCode :
682954
Title :
An evaluation of fabrication methods for doping superlattice devices
Author :
Slocum, Michael A. ; Forbes, David V. ; Bohra, Mihir H. ; Hubbard, Seth M.
Author_Institution :
Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1727
Lastpage :
1732
Abstract :
Recent developments have been made in the fabrication of doping superlattice solar cells. Two main fabrication methods are presented, which demonstrate progress towards the objective of an optimized contacting method for lateral carrier selective contacts. The work presented here discusses contact formation via diffused junction and higher bandgap epitaxial regrowth, and the changes made to achieve 9.0% efficient solar cells through epitaxial regrowth. To date GaAs regrowth is the most robust fabrication method, however InGaP2 regrowths show the potential of increased VOC while diffused junction devices show potential if the diffusion process can be optimized.
Keywords :
III-V semiconductors; epitaxial growth; gallium arsenide; indium compounds; semiconductor doping; semiconductor superlattices; solar cells; wide band gap semiconductors; GaAs; InGaP2; diffused junction device; doping superlattice device; doping superlattice solar cell; epitaxial regrowth; robust fabrication method; Current measurement; Doping; Epitaxial growth; Gallium arsenide; Junctions; Sun; Superlattices; doping superlattice; nipi; quantum well; re-growth;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744477
Filename :
6744477
Link To Document :
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