DocumentCode
682954
Title
An evaluation of fabrication methods for doping superlattice devices
Author
Slocum, Michael A. ; Forbes, David V. ; Bohra, Mihir H. ; Hubbard, Seth M.
Author_Institution
Rochester Inst. of Technol., Rochester, NY, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
1727
Lastpage
1732
Abstract
Recent developments have been made in the fabrication of doping superlattice solar cells. Two main fabrication methods are presented, which demonstrate progress towards the objective of an optimized contacting method for lateral carrier selective contacts. The work presented here discusses contact formation via diffused junction and higher bandgap epitaxial regrowth, and the changes made to achieve 9.0% efficient solar cells through epitaxial regrowth. To date GaAs regrowth is the most robust fabrication method, however InGaP2 regrowths show the potential of increased VOC while diffused junction devices show potential if the diffusion process can be optimized.
Keywords
III-V semiconductors; epitaxial growth; gallium arsenide; indium compounds; semiconductor doping; semiconductor superlattices; solar cells; wide band gap semiconductors; GaAs; InGaP2; diffused junction device; doping superlattice device; doping superlattice solar cell; epitaxial regrowth; robust fabrication method; Current measurement; Doping; Epitaxial growth; Gallium arsenide; Junctions; Sun; Superlattices; doping superlattice; nipi; quantum well; re-growth;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744477
Filename
6744477
Link To Document