Title :
Modeling and analysis of multicolored anti-reflection coatings with high transmittance for different solar cell materials
Author :
Lumb, Matthew P. ; Woojun Yoon ; Bailey, Christopher G. ; Scheiman, David ; Tischler, Joseph G. ; Walters, R.J.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
In this work solar cell anti-reflection coatings tuned to give a specific hue under solar illumination are investigated. We demonstrate that it is possible to form patterned coatings with large color contrast and high transmittance. We use colorimetric and thin film optics models to explore the relationship between the color and performance of bilayer anti-reflection coatings on crystalline Si, amorphous Si and GaAs. The colorimetric predictions were verified by measuring a series of coatings deposited on Si substrates. Finally, a patterned Si sample was produced using a simple, low-cost photolithography procedure to selectively etch only the top layer of a bilayer coating to demonstrate a high-performance anti-reflection coating with strong color contrast.
Keywords :
antireflection coatings; photolithography; semiconductor thin films; silicon; solar cells; bilayer antireflection coatings; colorimetric; colorimetric predictions; high-performance antireflection coating; multicolored antireflection coatings analysis; multicolored antireflection coatings modeling; photolithography procedure; solar cell antireflection coatings; solar cell materials; solar illumination; thin film optics models; transmittance; Coatings; Color; Gallium arsenide; Image color analysis; Photovoltaic cells; Reflectivity; Silicon; Antireflection Coatings; Colorimetry;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744512