• DocumentCode
    683124
  • Title

    Bridging the Gap: Modeling the variation due to grain size distribution in CdTe solar cells

  • Author

    Mungan, Elif Selin ; Dongaonkar, Sourabh ; Alam, Md. Ashraful

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    2007
  • Lastpage
    2010
  • Abstract
    In this paper, we develop a multi-scale, hierarchical cell-to-module modeling approach to interpret and predict the effects of average grain size and grain size distribution on the cell efficiency of polycrystalline thin film solar cells, specifically, that of close space sublimated (CSS) CdTe. Our results explain why (1) increasing grain size improves cell performance, (2) the performance saturates beyond a critical grain size, (3) the effect of grain size distribution is averaged over larger length-scales, and therefore, (4) the observed empirical distribution of module efficacy must be attributed to sources other than grain-size distribution.
  • Keywords
    II-VI semiconductors; cadmium compounds; grain boundaries; grain size; integrated circuit modelling; numerical analysis; semiconductor thin films; solar cells; statistical analysis; thin film devices; CSS; CdTe; average grain size effects; cell efficiency; close space sublimated CdTe; grain boundaries; grain size distribution; length-scales; module efficacy; multiscale hierarchical cell-to-module modeling approach; numerical simulations; polycrystalline thin film solar cells; solar cells; statistical analysis; Cascading style sheets; Computational modeling; Grain size; Integrated circuit modeling; Numerical models; Photovoltaic cells; Predictive models; grain boundaries; numerical simulations; photovoltaic cells; statistical analysis; thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744866
  • Filename
    6744866