DocumentCode :
683170
Title :
Laser fired contact for n-type crystalline Si solar cell
Author :
Jianbo He ; Hegedus, Steven ; Das, Udhab ; Zhan Shu ; Bennett, Mark ; Birkmire, Robert
Author_Institution :
Inst. of Energy Conversion, Univ. of Delaware, Newark, DE, USA
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2201
Lastpage :
2204
Abstract :
Ohmic contacts to n-type crystalline silicon created by local laser firing was studied in this paper. A novel metal stack of Al-Sb-Ti was fired through a dielectric layer or opposite doped amorphous silicon layer. Specific contact resistances of less than 1.9 mΩcm2 and 0.31 mΩcm2 using a pseudo transfer length method and a vertical test structure, respectively, are demonstrated. Recombination loss due to laser damage was consistent with an extracted local Surface Recombination Velocity (SRV) ~20,000 cm/s similar to values for laser fired base contact for p-type crystalline silicon. Hetero-junction devices were fabricated with laser fired back contact and proof-of-concept efficiencies of 14.4% on front silicon hetero-junction and 13.1% on interdigitated back contact silicon hetero-junction (IBC-SHJ) cells were achieved. This localized base contact technique will enable low cost back contact patterning and innovative design for n type crystalline solar cells.
Keywords :
aluminium; antimony; contact resistance; elemental semiconductors; laser materials processing; ohmic contacts; semiconductor heterojunctions; silicon; solar cells; surface recombination; titanium; Al-Sb-Ti; IBC-SHJ cells; SRV; Si; dielectric layer; efficiency 14.4 percent; extracted local surface recombination velocity; front silicon heterojunction; heterojunction devices; interdigitated back contact silicon heterojunction; local laser fired back contact; localized base contact technique; low cost back contact patterning; metal stack; n-type crystalline silicon solar cell; ohmic contacts; opposite doped amorphous silicon layer; p-type crystalline silicon; pseudotransfer length method; recombination loss; specific contact resistances; vertical test structure; Contact resistance; Firing; Metals; Photovoltaic cells; Resistance; Silicon; Surface emitting lasers; interdigitated back contact; laser fired contact; laser processing; photovoltaic cells; silicon heterojunction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744912
Filename :
6744912
Link To Document :
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