• DocumentCode
    683237
  • Title

    Tunnel-junction-free GaAs/Si tandem solar cells by self-aligned wafer bonding technology

  • Author

    Ruizhe Yao ; Zihao Wang ; Kuperinik, Jacob ; Weiming Wang ; Wei Guo

  • Author_Institution
    Rochester Inst. of Technol., Rochester, NY, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    2483
  • Lastpage
    2485
  • Abstract
    GaAs/Si double junction solar cells are demonstrated by novel self-aligned wafer bonding techniques. The GaAs top junction is grown by metalorganic chemical vapor deposition (MOCVD) and the Si bottom junction is achieved by ion implantation. The two-junction solar cells are connected in series by Au/Si eutectic bonding, where the top and bottom cells were self-aligned by utilizing the Au/Si eutectic alloy as the interconnection metals and GaAs top cells as the etching mask. The Au/Si eutectic bonding was characterized by transmission electron microscope (TEM), scanning electron microscope (SEM) and current-voltage (I-V) measurements. A moderate conversion efficiency improvement of the GaAs/Si tandem cells compared to GaAs single junction cells is measured, while tandem cells with different top and bottom cell areal ratios are also investigated to achieve better current matching.
  • Keywords
    MOCVD; electric current measurement; scanning electron microscopy; solar cells; transmission electron microscopy; voltage measurement; GaAs-Si; current matching; current-voltage measurements; double junction solar cells; eutectic bonding; metalorganic chemical vapor deposition; scanning electron microscope; self-aligned wafer bonding technology; single junction cells; transmission electron microscope; tunnel-junction-free; Bonding; Gallium arsenide; Gold; Junctions; Photovoltaic cells; Silicon; GaAs/Si; eutectic bonding; self-aligned; tandem cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744979
  • Filename
    6744979