DocumentCode
683237
Title
Tunnel-junction-free GaAs/Si tandem solar cells by self-aligned wafer bonding technology
Author
Ruizhe Yao ; Zihao Wang ; Kuperinik, Jacob ; Weiming Wang ; Wei Guo
Author_Institution
Rochester Inst. of Technol., Rochester, NY, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
2483
Lastpage
2485
Abstract
GaAs/Si double junction solar cells are demonstrated by novel self-aligned wafer bonding techniques. The GaAs top junction is grown by metalorganic chemical vapor deposition (MOCVD) and the Si bottom junction is achieved by ion implantation. The two-junction solar cells are connected in series by Au/Si eutectic bonding, where the top and bottom cells were self-aligned by utilizing the Au/Si eutectic alloy as the interconnection metals and GaAs top cells as the etching mask. The Au/Si eutectic bonding was characterized by transmission electron microscope (TEM), scanning electron microscope (SEM) and current-voltage (I-V) measurements. A moderate conversion efficiency improvement of the GaAs/Si tandem cells compared to GaAs single junction cells is measured, while tandem cells with different top and bottom cell areal ratios are also investigated to achieve better current matching.
Keywords
MOCVD; electric current measurement; scanning electron microscopy; solar cells; transmission electron microscopy; voltage measurement; GaAs-Si; current matching; current-voltage measurements; double junction solar cells; eutectic bonding; metalorganic chemical vapor deposition; scanning electron microscope; self-aligned wafer bonding technology; single junction cells; transmission electron microscope; tunnel-junction-free; Bonding; Gallium arsenide; Gold; Junctions; Photovoltaic cells; Silicon; GaAs/Si; eutectic bonding; self-aligned; tandem cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744979
Filename
6744979
Link To Document