• DocumentCode
    683256
  • Title

    Micro-Raman/PL and Micro-LBIC studies of CZTSe materials and PV devices

  • Author

    Qiong Chen ; Naili Yue ; Yong Zhang

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    2567
  • Lastpage
    2571
  • Abstract
    Micro-Raman/PL/LBIC (Laser Beam Induced Current) was applied to investigate the homogeneity of polycrystalline Cu2ZnSnSe4 (CZTSe) thin-films from both front surface and cleaved edge with sub-micron spatial resolution. By comparing the materials before and after CdS coating, we have investigated the effect of non-uniformity of CdS layer on the spatial variation of the photo-response, correlating to the μ-Raman/PL probes. The CdS induced spatial variation is found to be a source of inhomogeneity in addition to that of the absorber layer itself. The devices investigated typically have > 8.5% efficiency. The contrast of the LBIC signal adjacent to the CdS rich area is found to depend on excitation laser power, indicating a potential for further efficiency improvement. Cleaved edge Raman probe has revealed possible variation in the compositions along the growth direction.
  • Keywords
    Raman spectra; cadmium compounds; laser materials processing; photoluminescence; photovoltaic cells; semiconductor thin films; tin compounds; zinc compounds; Cu2ZnSnSe4; LBIC signal; absorber layer; coating; excitation laser power; laser beam induced current; microRaman spectra; photoluminescence; photovoltaic device; polycrystalline thin films; Laser excitation; Nonhomogeneous media; Performance evaluation; Power lasers; Probes; Spatial resolution; CZTSe; CdS; LBIC Micro-Raman; cleaved edge; solar cell; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744998
  • Filename
    6744998